IEC 60747-11 Ed. 1.0 b:1985
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- IEC
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Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.
Product Details
- Edition:
- 1.0
- Published:
- 01/01/1985
- Number of Pages:
- 35
- File Size:
- 1 file , 1.3 MB
