IEC 60749-22 Ed. 1.0 b:2002
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Applicable to semiconductor devices (discrete devices and integrated circuits), this test measures bond strength or determine compliance with specified bond strength requirements
Product Details
- Edition:
- 1.0
- Published:
- 09/12/2002
- Number of Pages:
- 41
- File Size:
- 1 file , 720 KB
