IEC 60749-31 Ed. 1.0 b:2002
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Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads.
Product Details
- Edition:
- 1.0
- Published:
- 08/30/2002
- Number of Pages:
- 9
- File Size:
- 1 file , 330 KB
