IEC 60749-9 Ed. 1.0 b:2002

• by admin
• Comments Off on IEC 60749-9 Ed. 1.0 b:2002
• IEC

Click here to purchase
Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.

Product Details

Edition:

1.0

Published:

04/12/2002

Number of Pages:

9

File Size:

1 file , 410 KB