IEC 61580-2 Ed. 1.0 b:1996
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- IEC
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Describes the test procedure intended to characterise the level of unwanted signals caused by the presence of two or more transmitting signals in waveguides or waveguide assemblies.
Product Details
- Edition:
- 1.0
- Published:
- 06/11/1996
- Number of Pages:
- 17
- File Size:
- 1 file , 680 KB
