IEC 61788-15 Ed. 1.0 b:2011

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IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Z_s) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Z_s at the resonant frequency f₀.

Product Details

Edition:

1.0

Published:

10/24/2011

Number of Pages:

96

File Size:

1 file , 1.6 MB