IEC 62047-29 Ed. 1.0 en:2017
- Comments Off on IEC 62047-29 Ed. 1.0 en:2017
- IEC
Click here to purchase
IEC 62047-29:2017(E) specifies a relaxation test method for measuring electromechanical properties of freestanding conductive thin films for micro-electromechanical systems (MEMS) under controlled strain and room temperature. Freestanding thin films of conductive materials are extensively utilized in MEMS, opto-electronics, and flexible/wearable electronics products. Freestanding thin films in the products experience external and internal stresses which could be relaxed even under room temperature during a period of operation, and this relaxation leads to time-dependent variation of electrical performances of the products. This test method is valid for isotropic, homogeneous, and linearly viscoelastic materials.
Product Details
- Edition:
- 1.0
- Published:
- 11/22/2017
- Number of Pages:
- 12
- File Size:
- 1 file , 600 KB
