IEC 62416 Ed. 1.0 b:2010
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IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Product Details
- Edition:
- 1.0
- Published:
- 04/26/2010
- Number of Pages:
- 20
- File Size:
- 1 file , 890 KB
