BS DD ENV 50218:1996
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Documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC).
Cross References:
CENELEC R117-001
CENELEC R117-004
CENELEC R117-005
CENELEC R117-006
CENELEC R117-10
CENELEC prENV 50208-6
CENELEC ENV 50219
Product Details
- Published:
- 09/15/1996
- ISBN(s):
- 0580261794
- Number of Pages:
- 26
- File Size:
- 1 file , 1.1 MB
- Product Code(s):
- 00824420, 00824420
