JEDEC JESD 372 (R2009)

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This standard describes the method to be used for the measurement of small-signal VHF-UHF transistor admittance parameters, in preparing data sheets for JEDEC registration of low power transistors. Formerly known as RS-372 and/or EIA-372.

Product Details

Published:
05/01/1970
Number of Pages:
13
File Size:
1 file , 350 KB

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